A fast methodology to determine characteristics of thousands of grains using 3DXRD. I. Overlapping diffraction peaks and parameters of the experimental setup.

H Sharma; RM Huizenga; SE Offerman

doi:10.1107/S0021889812025563

A fast methodology to determine characteristics of thousands of grains using 3DXRD. I. Overlapping diffraction peaks and parameters of the experimental setup.

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	693-704
Number of pages	12
Journal	Journal of Applied Crystallography
Volume	45
DOIs	https://doi.org/10.1107/S0021889812025563
Publication status	Published - 2012

Keywords

CWTS JFIS >= 2.00

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10.1107/S0021889812025563

Cite this

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title = "A fast methodology to determine characteristics of thousands of grains using 3DXRD. I. Overlapping diffraction peaks and parameters of the experimental setup.",

keywords = "CWTS JFIS >= 2.00",

author = "H Sharma and RM Huizenga and SE Offerman",

year = "2012",

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language = "English",

volume = "45",

pages = "693--704",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

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AU - Sharma, H

AU - Huizenga, RM

AU - Offerman, SE

PY - 2012

Y1 - 2012

KW - CWTS JFIS >= 2.00

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DO - 10.1107/S0021889812025563

M3 - Article

SN - 0021-8898

VL - 45

SP - 693

EP - 704

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

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