A high speed measurement protocol for optimizing amplifier linearity

MP van der Heijden, B Rejaei Salmassi, LCN de Vreede

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ProRisc2000 CD-ROM
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	307-310
Number of pages	4
ISBN (Print)	90-73461-24-3
Publication status	Published - 2000
Event	Workshop on Circuits, Systems and Signal Processing, Veldhoven - Utrecht Duration: 29 Nov 2000 → 30 Nov 2000

Name
Publisher	STW technology foundation

Conference	Workshop on Circuits, Systems and Signal Processing, Veldhoven
Period	29/11/00 → 30/11/00

Keywords

@inproceedings{0ecae90640834342b0a1c9ca2caae655,

title = "A high speed measurement protocol for optimizing amplifier linearity",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van der Heijden}, MP and {Rejaei Salmassi}, B and {de Vreede}, LCN",

year = "2000",

language = "Undefined/Unknown",

isbn = "90-73461-24-3",

publisher = "STW Technology Foundation",

pages = "307--310",

booktitle = "ProRisc2000 CD-ROM",

note = "Workshop on Circuits, Systems and Signal Processing, Veldhoven ; Conference date: 29-11-2000 Through 30-11-2000",

}

TY - GEN

T1 - A high speed measurement protocol for optimizing amplifier linearity

AU - van der Heijden, MP

AU - Rejaei Salmassi, B

AU - de Vreede, LCN

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 90-73461-24-3

SP - 307

EP - 310

BT - ProRisc2000 CD-ROM

PB - STW Technology Foundation

CY - Utrecht

T2 - Workshop on Circuits, Systems and Signal Processing, Veldhoven

Y2 - 29 November 2000 through 30 November 2000

ER -