A Markovian, variation-aware circuit-level aging model

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	International symposium on nanoscale architectures
Editors	s.n.
Place of Publication	New York
Publisher	IEEE Society
Pages	1-7
Number of pages	7
Publication status	Published - 2012
Event	NANOARCH 2012 - New York Duration: 4 Jul 2012 → 6 Jul 2012

Name
Publisher	IEEE

Conference	NANOARCH 2012
Period	4/07/12 → 6/07/12

Cite this

@inproceedings{136decb175074ec285edc55bb7257588,

title = "A Markovian, variation-aware circuit-level aging model",

author = "{Cucu Laurenciu}, N and SD Cotofana",

year = "2012",

language = "English",

publisher = "IEEE Society",

pages = "1--7",

editor = "s.n.",

booktitle = "International symposium on nanoscale architectures",

note = "NANOARCH 2012 ; Conference date: 04-07-2012 Through 06-07-2012",

}

TY - GEN

T1 - A Markovian, variation-aware circuit-level aging model

AU - Cucu Laurenciu, N

AU - Cotofana, SD

PY - 2012

Y1 - 2012

UR - http://ce-publications.et.tudelft.nl/publications/1317_a_markovian_variationaware_circuitlevel_aging_model.pdf

M3 - Conference contribution

SP - 1

EP - 7

BT - International symposium on nanoscale architectures

A2 - s.n., null

PB - IEEE Society

CY - New York

T2 - NANOARCH 2012

Y2 - 4 July 2012 through 6 July 2012

ER -