A model-based approach to fault diagnosis of embedded systems

J Pietersma; AJC van Gemund; A Bos

A model-based approach to fault diagnosis of embedded systems

J Pietersma, AJC van Gemund, A Bos

Data-Intensive Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging
Editors	JJ van Wijk, JWJ Heijnsdijk, KG Langendoen, R Veltkamp
Place of Publication	Delft
Publisher	Advanced School for Computing and Imaging (ASCI)
Pages	189-196
Number of pages	8
ISBN (Print)	90-803086-9-2
Publication status	Published - 2004
Event	Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands - Delft Duration: 2 Jun 2004 → 4 Jun 2004

Publication series

Name
Publisher	Advanced School for Computing and imaging (ASCI)

Conference

Conference	Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands
Period	2/06/04 → 4/06/04

Keywords

Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{bbe0d8885c164f6b80ccacb3cf3dec31,

title = "A model-based approach to fault diagnosis of embedded systems",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "J Pietersma and {van Gemund}, AJC and A Bos",

year = "2004",

language = "Undefined/Unknown",

isbn = "90-803086-9-2",

publisher = "Advanced School for Computing and Imaging (ASCI)",

pages = "189--196",

editor = "{van Wijk}, JJ and JWJ Heijnsdijk and KG Langendoen and R Veltkamp",

booktitle = "ASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging",

note = "Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands ; Conference date: 02-06-2004 Through 04-06-2004",

}

Pietersma, J, van Gemund, AJC & Bos, A 2004, A model-based approach to fault diagnosis of embedded systems. in JJ van Wijk, JWJ Heijnsdijk, KG Langendoen & R Veltkamp (eds), ASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging. Advanced School for Computing and Imaging (ASCI), Delft, pp. 189-196, Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands, 2/06/04.

A model-based approach to fault diagnosis of embedded systems. / Pietersma, J; van Gemund, AJC; Bos, A.
ASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging. ed. / JJ van Wijk; JWJ Heijnsdijk; KG Langendoen; R Veltkamp. Delft: Advanced School for Computing and Imaging (ASCI), 2004. p. 189-196.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - A model-based approach to fault diagnosis of embedded systems

AU - Pietersma, J

AU - van Gemund, AJC

AU - Bos, A

PY - 2004

Y1 - 2004

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-803086-9-2

SP - 189

EP - 196

BT - ASCI 2004 Proceedings of the tenth annual conference of the Advanced School for Computing and Imaging

A2 - van Wijk, JJ

A2 - Heijnsdijk, JWJ

A2 - Langendoen, KG

A2 - Veltkamp, R

PB - Advanced School for Computing and Imaging (ASCI)

CY - Delft

T2 - Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands

Y2 - 2 June 2004 through 4 June 2004

ER -