@inproceedings{14609811a94543e88474fc7353bb41e3,
title = "A model-based approach to sequential fault diagnosis",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "J Pietersma and {van Gemund}, AJC and A Bos",
year = "2005",
language = "Undefined/Unknown",
isbn = "0-7803-9102-0",
publisher = "IEEE Society",
pages = "621--627",
editor = "S Karlovic and D Wallhermfechtel",
booktitle = "Autotestcon 2005 Proceedings",
note = "Autotestcon 2005 IEEE Systems Readiness Technology Conference, Orlando, FL, USA ; Conference date: 26-09-2005 Through 29-09-2005",
}