Abstract
This paper presents a modified self-consistent drift-diffusion-reaction model suitable for the analysis of electron-beam irradiated insulators at both short and long time scales. A novel boundary condition is employed that takes into account the reverse electron current and a fully dynamic trap-assisted generation-recombination mechanism is implemented. Sensitivity of the model with respect to material parameters is investigated and a calibration procedure is developed that reproduces experimental yield-energy curves for uncharged insulators. Long-time charging and yield variations are analyzed for stationary defocused and focused beams as well as moving beams dynamically scanning composite insulators.
Original language | English |
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Article number | 051307 |
Pages (from-to) | 1-24 |
Number of pages | 24 |
Journal | AIP Advances |
Volume | 8 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2018 |
Bibliographical note
greenKeywords
- Electron beams
- Signal processing
- Stellar structure and properties
- Electric currents
- Surface collisions