A new sharpness measure based on Gaussian lines and edges

J Dijk; M van Ginkel; RJ van Asselt; LJ van Vliet; PW Verbeek

A new sharpness measure based on Gaussian lines and edges

J Dijk, M van Ginkel, RJ van Asselt, LJ van Vliet, PW Verbeek

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings ASCI 2002
Editors	EF Deprettere, A Belloum, JWJ Heijnsdijk, F van der Stappen
Place of Publication	Delft
Publisher	ASCI
Pages	39-43
Number of pages	5
ISBN (Print)	90-803086-6-8
Publication status	Published - 2002
Event	8th Annual Conf. of the Advanced School for Computing and Imaging, Lochem - Delft Duration: 19 Jun 2002 → 21 Jun 2002

Publication series

Name
Publisher	ASCI

Conference

Conference	8th Annual Conf. of the Advanced School for Computing and Imaging, Lochem
Period	19/06/02 → 21/06/02

Bibliographical note

phpub 66

Keywords

conference contrib. non-refer.
Geen BTA classificatie

Cite this

@inproceedings{02a9f97de9214971968e2bc59b0d5596,

title = "A new sharpness measure based on Gaussian lines and edges",

keywords = "conference contrib. non-refer., Geen BTA classificatie",

author = "J Dijk and {van Ginkel}, M and {van Asselt}, RJ and {van Vliet}, LJ and PW Verbeek",

note = "phpub 66; 8th Annual Conf. of the Advanced School for Computing and Imaging, Lochem ; Conference date: 19-06-2002 Through 21-06-2002",

year = "2002",

language = "Undefined/Unknown",

isbn = "90-803086-6-8",

publisher = "ASCI",

pages = "39--43",

editor = "EF Deprettere and A Belloum and JWJ Heijnsdijk and {van der Stappen}, F",

booktitle = "Proceedings ASCI 2002",

}

TY - GEN

T1 - A new sharpness measure based on Gaussian lines and edges

AU - Dijk, J

AU - van Ginkel, M

AU - van Asselt, RJ

AU - van Vliet, LJ

AU - Verbeek, PW

N1 - phpub 66

PY - 2002

Y1 - 2002

KW - conference contrib. non-refer.

KW - Geen BTA classificatie

UR - http://www.ph.tn.tudelft.nl/People/bob/papers/asci_02_occ.pdf

M3 - Conference contribution

SN - 90-803086-6-8

SP - 39

EP - 43

BT - Proceedings ASCI 2002

A2 - Deprettere, EF

A2 - Belloum, A

A2 - Heijnsdijk, JWJ

A2 - van der Stappen, F

PB - ASCI

CY - Delft

T2 - 8th Annual Conf. of the Advanced School for Computing and Imaging, Lochem

Y2 - 19 June 2002 through 21 June 2002

ER -

A new sharpness measure based on Gaussian lines and edges

Publication series

Conference

Bibliographical note

Keywords

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Cite this