A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Gianluca Furano; Stefano Di Mascio; Tomasz Szewczyk; Alessandra Menicucci; Luigi Campajola; Francesco Di Capua; Andrea Fabbri; Marco Ottavi

doi:10.1109/DFT.2016.7684084

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Gianluca Furano, Stefano Di Mascio, Tomasz Szewczyk, Alessandra Menicucci, Luigi Campajola, Francesco Di Capua, Andrea Fabbri, Marco Ottavi

Space Systems Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Abstract

This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.

Original language	English
Title of host publication	2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	131-134
Number of pages	4
ISBN (Electronic)	9781509036233
DOIs	https://doi.org/10.1109/DFT.2016.7684084
Publication status	Published - 25 Oct 2016
Event	29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 - Storrs, United States Duration: 19 Sept 2016 → 20 Sept 2016

Conference

Conference	29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Country/Territory	United States
City	Storrs
Period	19/09/16 → 20/09/16

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10.1109/DFT.2016.7684084

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Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., Fabbri, A., & Ottavi, M. (2016). A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 (pp. 131-134). Article 7684084 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/DFT.2016.7684084

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title = "A novel method for SEE validation of complex SoCs using Low-Energy Proton beams",

abstract = "This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.",

author = "Gianluca Furano and {Di Mascio}, Stefano and Tomasz Szewczyk and Alessandra Menicucci and Luigi Campajola and {Di Capua}, Francesco and Andrea Fabbri and Marco Ottavi",

year = "2016",

month = oct,

day = "25",

doi = "10.1109/DFT.2016.7684084",

language = "English",

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booktitle = "2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 ; Conference date: 19-09-2016 Through 20-09-2016",

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Furano, G, Di Mascio, S, Szewczyk, T, Menicucci, A, Campajola, L, Di Capua, F, Fabbri, A & Ottavi, M 2016, A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. in 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016., 7684084, Institute of Electrical and Electronics Engineers (IEEE), pp. 131-134, 29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, United States, 19/09/16. https://doi.org/10.1109/DFT.2016.7684084

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. / Furano, Gianluca; Di Mascio, Stefano; Szewczyk, Tomasz et al.
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016. Institute of Electrical and Electronics Engineers (IEEE), 2016. p. 131-134 7684084.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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AU - Di Mascio, Stefano

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AU - Menicucci, Alessandra

AU - Campajola, Luigi

AU - Di Capua, Francesco

AU - Fabbri, Andrea

AU - Ottavi, Marco

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AB - This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.

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BT - 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016

PB - Institute of Electrical and Electronics Engineers (IEEE)

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Furano G, Di Mascio S, Szewczyk T, Menicucci A, Campajola L, Di Capua F et al. A novel method for SEE validation of complex SoCs using Low-Energy Proton beams. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016. Institute of Electrical and Electronics Engineers (IEEE). 2016. p. 131-134. 7684084 doi: 10.1109/DFT.2016.7684084

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

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