Original languageEnglish
Title of host publicationIEEE International Integrated Reliability Workshop Final Report
EditorsC Young, R Geilenkeuser
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages102-105
Number of pages4
ISBN (Print)978-1-4244-8524-6
DOIs
Publication statusPublished - 2010
EventIRW2010 - Piscataway, NJ, USA
Duration: 17 Oct 201021 Oct 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceIRW2010
Period17/10/1021/10/10

    Research areas

  • Elektrotechniek, Techniek, Conf.proc. > 3 pag

ID: 1997272