Original language | English |
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Title of host publication | IEEE International Integrated Reliability Workshop Final Report |
Editors | C Young, R Geilenkeuser |
Place of Publication | Piscataway, NJ, USA |
Publisher | IEEE Society |
Pages | 102-105 |
Number of pages | 4 |
ISBN (Print) | 978-1-4244-8524-6 |
DOIs | |
Publication status | Published - 2010 |
Event | IRW2010 - Piscataway, NJ, USA Duration: 17 Oct 2010 → 21 Oct 2010 |
Publication series
Name | |
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Publisher | IEEE |
Conference
Conference | IRW2010 |
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Period | 17/10/10 → 21/10/10 |
Bibliographical note
neoKeywords
- Elektrotechniek
- Techniek
- Conf.proc. > 3 pag