A Novel Virtual Age Reliability Model for Time-toFailure Prediction

Y Wang, SD Cotofana

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE International Integrated Reliability Workshop Final Report
EditorsC Young, R Geilenkeuser
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages102-105
Number of pages4
ISBN (Print)978-1-4244-8524-6
DOIs
Publication statusPublished - 2010
EventIRW2010 - Piscataway, NJ, USA
Duration: 17 Oct 201021 Oct 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceIRW2010
Period17/10/1021/10/10

Bibliographical note

neo

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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