Documents

DOI

In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation conditions of the entire LED array. A physics-of-failure based reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and the catastrophic failure. Electronic-thermal simulations are utilized to obtain operation conditions, including temperature and current. Meanwhile, statistical models are applied to calculate possibilities of the catastrophic failure in different operation conditions.

Original languageEnglish
Title of host publication2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1-5
Number of pages5
ISBN (Electronic)978-1-5090-4344-6
DOIs
Publication statusPublished - 2017
EventEuroSimE 2017: 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Dresden, Germany
Duration: 3 Apr 20175 Apr 2017

Conference

ConferenceEuroSimE 2017
CountryGermany
CityDresden
Period3/04/175/04/17

    Research areas

  • Electrolytic Capacitor-Free LED Driver, MOSFET, Reliability

ID: 52023430