A PoF and statistics combined reliability prediction for LED arrays in lamps

Bo Sun, Xuejun Fan, Jiajie Fan, G.Q. Zhang, Cheng Qian

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
32 Downloads (Pure)

Abstract

In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation conditions of the entire LED array. A physics-of-failure based reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and the catastrophic failure. Electronic-thermal simulations are utilized to obtain operation conditions, including temperature and current. Meanwhile, statistical models are applied to calculate possibilities of the catastrophic failure in different operation conditions.

Original languageEnglish
Title of host publication2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1-5
Number of pages5
ISBN (Electronic)978-1-5090-4344-6
DOIs
Publication statusPublished - 2017
Event18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017: 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Dresden, Germany
Duration: 3 Apr 20175 Apr 2017

Conference

Conference18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017
Country/TerritoryGermany
CityDresden
Period3/04/175/04/17

Keywords

  • Electrolytic Capacitor-Free LED Driver
  • MOSFET
  • Reliability

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