A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps

Bo Sun; Jiajie Fan; Xuejun Fan; Guoqi Zhang

doi:10.1109/EuroSimE.2018.8369897

A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps

Bo Sun, Jiajie Fan, Xuejun Fan, Guoqi Zhang

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

41 Downloads (Pure)

Abstract

This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode.

Original language	English
Title of host publication	2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Electronic)	978-1-5386-2359-6
DOIs	https://doi.org/10.1109/EuroSimE.2018.8369897
Publication status	Published - 2018
Event	EuroSimE 2018: 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Toulouse, France Duration: 15 Apr 2018 → 18 Apr 2018

Conference

Conference	EuroSimE 2018
Abbreviated title	EuroSimE 2018
Country/Territory	France
City	Toulouse
Period	15/04/18 → 18/04/18

Bibliographical note

Accepted author manuscript

Keywords

Reliability
Junctions
LED lamps
Light sources
Temperature distribution
Integrated circuit modeling

Access to Document

10.1109/EuroSimE.2018.8369897

51127845 - 2018 EuroSime FullAccepted author manuscript, 437 KB

Cite this

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title = "A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps",

abstract = "This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode.",

keywords = "Reliability, Junctions, LED lamps, Light sources, Temperature distribution, Integrated circuit modeling",

author = "Bo Sun and Jiajie Fan and Xuejun Fan and Guoqi Zhang",

note = "Accepted author manuscript; EuroSimE 2018 : 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018 ; Conference date: 15-04-2018 Through 18-04-2018",

year = "2018",

doi = "10.1109/EuroSimE.2018.8369897",

language = "English",

pages = "1--5",

booktitle = "2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018",

publisher = "IEEE",

address = "United States",

}

Sun, B, Fan, J, Fan, X & Zhang, G 2018, A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps. in 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018. IEEE, Piscataway, NJ, pp. 1-5, EuroSimE 2018, Toulouse, France, 15/04/18. https://doi.org/10.1109/EuroSimE.2018.8369897

A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps. / Sun, Bo; Fan, Jiajie; Fan, Xuejun et al.
2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018. Piscataway, NJ: IEEE, 2018. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps

AU - Sun, Bo

AU - Fan, Jiajie

AU - Fan, Xuejun

AU - Zhang, Guoqi

N1 - Accepted author manuscript

PY - 2018

Y1 - 2018

N2 - This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode.

AB - This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode.

KW - Reliability

KW - Junctions

KW - LED lamps

KW - Light sources

KW - Temperature distribution

KW - Integrated circuit modeling

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U2 - 10.1109/EuroSimE.2018.8369897

DO - 10.1109/EuroSimE.2018.8369897

M3 - Conference contribution

AN - SCOPUS:85048858478

SP - 1

EP - 5

BT - 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018

PB - IEEE

CY - Piscataway, NJ

T2 - EuroSimE 2018

Y2 - 15 April 2018 through 18 April 2018

ER -

A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps

Abstract

Conference

Bibliographical note

Keywords

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