This paper studies the interaction of catastrophic failure of the driver and LED luminous flux decay for an integrated LED lamp with an electrolytic capacitor-free LED driver. Electronic thermal simulations are utilized to obtain the lamp's dynamic history of temperature and current for two distinct operation modes: constant current mode (CCM) and constant light output (CLO) mode, respectively. Driver's mean time to failure (MTTF) and the LED's lifetime in terms of luminous flux are calculated. Under CLO mode, the LED's current increases exponentially to maintain the constant light output. As a result, the junction temperatures of LEDs, MOSFETs, and power diodes in driver rise significantly, leading to a much shorter MTTF and faster luminous flux depreciation. However, under the CCM, the junction temperatures of LEDs, MOSFETs, and diodes change modestly; therefore, the driver's MTTF and LED's luminous flux decay are not affected much by the variation of temperatures during LED's degradation process.

Original languageEnglish
Article number7935411
Pages (from-to)1081-1088
Number of pages8
JournalIEEE Transactions on Components, Packaging and Manufacturing Technology
Issue number7
Publication statusPublished - 2017

    Research areas

  • Catastrophic failure, electrolytic capacitor-free driver, electronic simulation, fault tree, LED lamp, lifetime, reliability, thermal simulation

ID: 45809123