Research output: Contribution to journal › Article › Scientific › peer-review
A Reliability Prediction Methodology for LED Arrays. / Sun, Bo; Fan, Jiajie; Fan, Xuejun; Zhang, Guoqi; Zhang, Guohao.
In: IEEE Access, Vol. 7, 8600302, 2019, p. 8127-8134.Research output: Contribution to journal › Article › Scientific › peer-review
}
TY - JOUR
T1 - A Reliability Prediction Methodology for LED Arrays
AU - Sun, Bo
AU - Fan, Jiajie
AU - Fan, Xuejun
AU - Zhang, Guoqi
AU - Zhang, Guohao
PY - 2019
Y1 - 2019
N2 - In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.
AB - In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.
KW - Catastrophic failure
KW - electronic-thermal model
KW - LED array
KW - Markov chain
KW - reliability prediction
UR - http://www.scopus.com/inward/record.url?scp=85060726739&partnerID=8YFLogxK
U2 - 10.1109/ACCESS.2018.2887252
DO - 10.1109/ACCESS.2018.2887252
M3 - Article
VL - 7
SP - 8127
EP - 8134
JO - IEEE Access
T2 - IEEE Access
JF - IEEE Access
SN - 2169-3536
M1 - 8600302
ER -
ID: 51152522