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A Reliability Prediction Methodology for LED Arrays. / Sun, Bo; Fan, Jiajie; Fan, Xuejun; Zhang, Guoqi; Zhang, Guohao.

In: IEEE Access, Vol. 7, 8600302, 2019, p. 8127-8134.

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Sun, Bo ; Fan, Jiajie ; Fan, Xuejun ; Zhang, Guoqi ; Zhang, Guohao. / A Reliability Prediction Methodology for LED Arrays. In: IEEE Access. 2019 ; Vol. 7. pp. 8127-8134.

BibTeX

@article{76847a92d4074a8eb26d4660282134a5,
title = "A Reliability Prediction Methodology for LED Arrays",
abstract = "In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.",
keywords = "Catastrophic failure, electronic-thermal model, LED array, Markov chain, reliability prediction",
author = "Bo Sun and Jiajie Fan and Xuejun Fan and Guoqi Zhang and Guohao Zhang",
year = "2019",
doi = "10.1109/ACCESS.2018.2887252",
language = "English",
volume = "7",
pages = "8127--8134",
journal = "IEEE Access",
issn = "2169-3536",
publisher = "IEEE",

}

RIS

TY - JOUR

T1 - A Reliability Prediction Methodology for LED Arrays

AU - Sun, Bo

AU - Fan, Jiajie

AU - Fan, Xuejun

AU - Zhang, Guoqi

AU - Zhang, Guohao

PY - 2019

Y1 - 2019

N2 - In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.

AB - In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.

KW - Catastrophic failure

KW - electronic-thermal model

KW - LED array

KW - Markov chain

KW - reliability prediction

UR - http://www.scopus.com/inward/record.url?scp=85060726739&partnerID=8YFLogxK

U2 - 10.1109/ACCESS.2018.2887252

DO - 10.1109/ACCESS.2018.2887252

M3 - Article

VL - 7

SP - 8127

EP - 8134

JO - IEEE Access

T2 - IEEE Access

JF - IEEE Access

SN - 2169-3536

M1 - 8600302

ER -

ID: 51152522