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A review on discoloration and high accelerated testing of optical materials in LED based-products. / Yazdan Mehr, M.; Toroghinejad, M.R.; Karimzadeh, F.; van Driel, W.D.; Zhang, G.Q.

In: Microelectronics Reliability, Vol. 81, 2018, p. 136-142.

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Yazdan Mehr, M. ; Toroghinejad, M.R. ; Karimzadeh, F. ; van Driel, W.D. ; Zhang, G.Q. / A review on discoloration and high accelerated testing of optical materials in LED based-products. In: Microelectronics Reliability. 2018 ; Vol. 81. pp. 136-142.

BibTeX

@article{5e1f7ffd61a74d07baa79ac2d3c85a6e,
title = "A review on discoloration and high accelerated testing of optical materials in LED based-products",
abstract = "Reduction of intensity of light output is one of the most common degradation modes in light-emitting diode (LED) systems. It starts from the failure of the various components in the system, including the chip, the driver, and optical components (i.e. phosphorous layer). The kinetics of degradation in real life applications is relatively slow and in most cases it takes several years to see an obvious deterioration of optical properties. Highly Accelerated Stress Testing (HAST) set-up and a methodology to extrapolate the results to real time applications are therefore needed to test the reliability of LED packages and lens materials. Using HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This paper aims at briefly clarifying the degradation mechanisms of optical components in LED packages and explaining how they contribute to the depreciation of light output of the LED systems. The concept of HAST and the way the reliability of LED packages can be evaluated will also be discussed.",
keywords = "Encapsulant, LED, Lens/encapsulant, Lumen depreciation, Reliability",
author = "{Yazdan Mehr}, M. and M.R. Toroghinejad and F. Karimzadeh and {van Driel}, W.D. and G.Q. Zhang",
year = "2018",
doi = "10.1016/j.microrel.2017.12.023",
language = "English",
volume = "81",
pages = "136--142",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - A review on discoloration and high accelerated testing of optical materials in LED based-products

AU - Yazdan Mehr, M.

AU - Toroghinejad, M.R.

AU - Karimzadeh, F.

AU - van Driel, W.D.

AU - Zhang, G.Q.

PY - 2018

Y1 - 2018

N2 - Reduction of intensity of light output is one of the most common degradation modes in light-emitting diode (LED) systems. It starts from the failure of the various components in the system, including the chip, the driver, and optical components (i.e. phosphorous layer). The kinetics of degradation in real life applications is relatively slow and in most cases it takes several years to see an obvious deterioration of optical properties. Highly Accelerated Stress Testing (HAST) set-up and a methodology to extrapolate the results to real time applications are therefore needed to test the reliability of LED packages and lens materials. Using HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This paper aims at briefly clarifying the degradation mechanisms of optical components in LED packages and explaining how they contribute to the depreciation of light output of the LED systems. The concept of HAST and the way the reliability of LED packages can be evaluated will also be discussed.

AB - Reduction of intensity of light output is one of the most common degradation modes in light-emitting diode (LED) systems. It starts from the failure of the various components in the system, including the chip, the driver, and optical components (i.e. phosphorous layer). The kinetics of degradation in real life applications is relatively slow and in most cases it takes several years to see an obvious deterioration of optical properties. Highly Accelerated Stress Testing (HAST) set-up and a methodology to extrapolate the results to real time applications are therefore needed to test the reliability of LED packages and lens materials. Using HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This paper aims at briefly clarifying the degradation mechanisms of optical components in LED packages and explaining how they contribute to the depreciation of light output of the LED systems. The concept of HAST and the way the reliability of LED packages can be evaluated will also be discussed.

KW - Encapsulant

KW - LED

KW - Lens/encapsulant

KW - Lumen depreciation

KW - Reliability

UR - http://www.scopus.com/inward/record.url?scp=85041480636&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2017.12.023

DO - 10.1016/j.microrel.2017.12.023

M3 - Article

VL - 81

SP - 136

EP - 142

JO - Microelectronics Reliability

T2 - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -

ID: 45808792