A study on combining sets of differently measured dissimilarities

A Ibba; RPW Duin

doi:http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820

A study on combining sets of differently measured dissimilarities

A Ibba, RPW Duin

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 20th International Conference on Pattern Recognition
Editors	JE Guerrero
Place of Publication	NY, NY, USA
Publisher	IEEE Society
Pages	3360-3364
Number of pages	5
ISBN (Print)	978-0-7695-4109-9
DOIs	https://doi.org/http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820
Publication status	Published - 2010
Event	20th International Conference on Pattern Recognition - NY, NY, USA Duration: 23 Aug 2010 → 26 Aug 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	20th International Conference on Pattern Recognition
Period	23/08/10 → 26/08/10

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820

Cite this

@inproceedings{510460cc68b0412eaf88d7fb9334fdee,

title = "A study on combining sets of differently measured dissimilarities",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "A Ibba and RPW Duin",

year = "2010",

doi = "http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820",

language = "English",

isbn = "978-0-7695-4109-9",

publisher = "IEEE Society",

pages = "3360--3364",

editor = "JE Guerrero",

booktitle = "Proceedings of the 20th International Conference on Pattern Recognition",

note = "20th International Conference on Pattern Recognition ; Conference date: 23-08-2010 Through 26-08-2010",

}

Ibba, A & Duin, RPW 2010, A study on combining sets of differently measured dissimilarities. in JE Guerrero (ed.), Proceedings of the 20th International Conference on Pattern Recognition. IEEE Society, NY, NY, USA, pp. 3360-3364, 20th International Conference on Pattern Recognition, 23/08/10. https://doi.org/http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820

TY - GEN

T1 - A study on combining sets of differently measured dissimilarities

AU - Ibba, A

AU - Duin, RPW

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820

DO - http://www.computer.org/portal/web/csdl/doi/10.1109/ICPR.2010.820

M3 - Conference contribution

SN - 978-0-7695-4109-9

SP - 3360

EP - 3364

BT - Proceedings of the 20th International Conference on Pattern Recognition

A2 - Guerrero, JE

PB - IEEE Society

CY - NY, NY, USA

T2 - 20th International Conference on Pattern Recognition

Y2 - 23 August 2010 through 26 August 2010

ER -