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A study on semi-supervised dissimilarity representation. / Dinh, VC; Duin, RPW; Loog, M.

Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). ed. / SN. Berlin, Germany : Springer, 2012. p. 2862-2864.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Harvard

Dinh, VC, Duin, RPW & Loog, M 2012, A study on semi-supervised dissimilarity representation. in SN (ed.), Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). Springer, Berlin, Germany, pp. 2862-2864, ICPR 2012, 11/11/12.

APA

Dinh, VC., Duin, RPW., & Loog, M. (2012). A study on semi-supervised dissimilarity representation. In SN (Ed.), Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012) (pp. 2862-2864). Berlin, Germany: Springer.

Vancouver

Dinh VC, Duin RPW, Loog M. A study on semi-supervised dissimilarity representation. In SN, editor, Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). Berlin, Germany: Springer. 2012. p. 2862-2864

Author

Dinh, VC ; Duin, RPW ; Loog, M. / A study on semi-supervised dissimilarity representation. Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012). editor / SN. Berlin, Germany : Springer, 2012. pp. 2862-2864

BibTeX

@inproceedings{b60ab6f1f09646a58d98b3fe78d70941,
title = "A study on semi-supervised dissimilarity representation",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "VC Dinh and RPW Duin and M Loog",
year = "2012",
language = "English",
isbn = "978-4-9906441-1-6",
publisher = "Springer",
pages = "2862--2864",
editor = "SN",
booktitle = "Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012)",

}

RIS

TY - GEN

T1 - A study on semi-supervised dissimilarity representation

AU - Dinh, VC

AU - Duin, RPW

AU - Loog, M

PY - 2012

Y1 - 2012

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-4-9906441-1-6

SP - 2862

EP - 2864

BT - Proceedings of 21st International Conference on Pattern Recognition (ICPR 2012)

A2 - SN, null

PB - Springer

CY - Berlin, Germany

ER -

ID: 3284667