A study on the robustness of Pseudo Random Binary Array based surface characterization

HJW Spoelder, FM Vos, EM Petriu, FCA Groen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProc. IEEE IMTC
    EditorsJM Cortner
    Pages2-7
    Number of pages6
    Publication statusPublished - 1998

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