In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.
Original languageEnglish
Title of host publication2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1-5
Number of pages5
ISBN (Electronic)978-1-5090-2106-2
DOIs
Publication statusPublished - 18 Apr 2016
EventEuroSimE 2016: 17th International Conference on Thermal Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Montpellier, France
Duration: 17 Apr 201620 Apr 2016
Conference number: 17
https://www.eurosime.org/index.php/2016-montpellier/

Conference

ConferenceEuroSimE 2016
CountryFrance
CityMontpellier
Period17/04/1620/04/16
Internet address

    Research areas

  • Reliability, MOSFET, Electrolytic Capacitor-Free LED Driver

ID: 19339156