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A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches. / Perez, Alexandre; Abreu, Rui; Deursen, Arie van.

Proceedings of the 39th International Conference on Software Engineering (ICSE). IEEE, 2017. p. 654-664.

Research output: Scientific - peer-reviewConference contribution

Harvard

Perez, A, Abreu, R & Deursen, AV 2017, A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches. in Proceedings of the 39th International Conference on Software Engineering (ICSE). IEEE, pp. 654-664. DOI: 10.1109/ICSE.2017.66

APA

Perez, A., Abreu, R., & Deursen, A. V. (2017). A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches. In Proceedings of the 39th International Conference on Software Engineering (ICSE). (pp. 654-664). IEEE. DOI: 10.1109/ICSE.2017.66

Vancouver

Perez A, Abreu R, Deursen AV. A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches. In Proceedings of the 39th International Conference on Software Engineering (ICSE). IEEE. 2017. p. 654-664. Available from, DOI: 10.1109/ICSE.2017.66

Author

Perez, Alexandre; Abreu, Rui; Deursen, Arie van / A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches.

Proceedings of the 39th International Conference on Software Engineering (ICSE). IEEE, 2017. p. 654-664.

Research output: Scientific - peer-reviewConference contribution

BibTeX

@inbook{3c5ea740d6f743a8a584db0f0cf5f72f,
title = "A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches",
author = "Alexandre Perez and Rui Abreu and Deursen, {Arie van}",
year = "2017",
doi = "10.1109/ICSE.2017.66",
pages = "654--664",
booktitle = "Proceedings of the 39th International Conference on Software Engineering (ICSE)",
publisher = "IEEE",
address = "United States",

}

RIS

TY - CHAP

T1 - A Test-suite Diagnosability Metric for Spectrum-based Fault Localization Approaches

AU - Perez,Alexandre

AU - Abreu,Rui

AU - Deursen,Arie van

PY - 2017

Y1 - 2017

N2 - Current metrics for assessing the adequacy of a test- suite plainly focus on the number of components (be it lines, branches, paths) covered by the suite, but do not explicitly check how the tests actually exercise these components and whether they provide enough information so that spectrum-based fault localization techniques can perform accurate fault isolation. We propose a metric, called DDU, aimed at complementing adequacy measurements by quantifying a test-suite’s diagnosability, i.e., the effectiveness of applying spectrum-based fault localization to pinpoint faults in the code in the event of test failures. Our aim is to increase the value generated by creating thorough test-suites, so they are not only regarded as error detection mechanisms but also as effective diagnostic aids that help widely-used fault- localization techniques to accurately pinpoint the location of bugs in the system. Our experiments show that optimizing a test suite with respect to DDU yields a 34% gain in spectrum-based fault localization report accuracy when compared to the standard branch-coverage metric.

AB - Current metrics for assessing the adequacy of a test- suite plainly focus on the number of components (be it lines, branches, paths) covered by the suite, but do not explicitly check how the tests actually exercise these components and whether they provide enough information so that spectrum-based fault localization techniques can perform accurate fault isolation. We propose a metric, called DDU, aimed at complementing adequacy measurements by quantifying a test-suite’s diagnosability, i.e., the effectiveness of applying spectrum-based fault localization to pinpoint faults in the code in the event of test failures. Our aim is to increase the value generated by creating thorough test-suites, so they are not only regarded as error detection mechanisms but also as effective diagnostic aids that help widely-used fault- localization techniques to accurately pinpoint the location of bugs in the system. Our experiments show that optimizing a test suite with respect to DDU yields a 34% gain in spectrum-based fault localization report accuracy when compared to the standard branch-coverage metric.

U2 - 10.1109/ICSE.2017.66

DO - 10.1109/ICSE.2017.66

M3 - Conference contribution

SP - 654

EP - 664

BT - Proceedings of the 39th International Conference on Software Engineering (ICSE)

PB - IEEE

ER -

ID: 11926560