Absolute distance metrology for space interferometers

BL Swinkels, TJ Wendrich, N Bhattacharya, A Wielders, JJM Braat

Research output: Contribution to journal › Conference article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	314-318
Number of pages	5
Journal	Proceedings of SPIE- International Society for Optical Engineering
Volume	5495
Publication status	Published - 2004

Keywords

@article{536b11b64e9947c4849005b33afb3a56,

title = "Absolute distance metrology for space interferometers",

keywords = "conference contrib. refereed, Peer-lijst tijdschrift",

author = "BL Swinkels and TJ Wendrich and N Bhattacharya and A Wielders and JJM Braat",

year = "2004",

language = "Undefined/Unknown",

volume = "5495",

pages = "314--318",

journal = "Proceedings of SPIE- International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

TY - JOUR

T1 - Absolute distance metrology for space interferometers

AU - Swinkels, BL

AU - Wendrich, TJ

AU - Bhattacharya, N

AU - Wielders, A

AU - Braat, JJM

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Peer-lijst tijdschrift

M3 - Conference article

SN - 0277-786X

VL - 5495

SP - 314

EP - 318

JO - Proceedings of SPIE- International Society for Optical Engineering

JF - Proceedings of SPIE- International Society for Optical Engineering

ER -