Abstract
Light Emitting Diode (LED) luminaires and lamps are energy-saving and environmental friendly alternatives to traditional lighting products. However, current luminous flux depreciation test at luminaire and lamp level requires a minimum of 6000 h testing, which is even longer than the product development cycle time. This paper develops an accelerated test method for luminous flux depreciation to reduce the test time within 2000 h at an elevated temperature. The method is based on lumen maintenance boundary curve, obtained from a collection of LED source lumen depreciation data, known as LM-80 data. The exponential decay model and Arrhenius acceleration relationship are used to determine the new threshold of lumen maintenance and acceleration factor. The proposed method has been verified by a number of simulation studies and experimental data for a wide range of LED luminaire and lamp types from both internal and external experiments. The qualification results obtained by the accelerated test method agree well with traditional 6000 h tests.
Original language | English |
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Pages (from-to) | 84-92 |
Number of pages | 9 |
Journal | Reliability Engineering & System Safety |
Volume | 147 |
Issue number | March |
DOIs | |
Publication status | Published - 2016 |
Keywords
- LED luminaire and lamp
- Luminous flux depreciation
- Lumen maintenance
- Accelerated test
- LM-80
- Boundary curve