An Empirical Study on the Usage of Testability Information to Fault Localization in Software

A Gonzalez Sanchez; RF Lima Maranhao De Abreu; HG Gross; AJC van Gemund

doi:10.1145/1982185.1982489

An Empirical Study on the Usage of Testability Information to Fault Localization in Software

A Gonzalez Sanchez, RF Lima Maranhao De Abreu, HG Gross, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	English
Title of host publication	2011 ACM International Symposium on Applied Computing (SAC'11)
Editors	W Chu, WE Wang, MJ Palakal, C-C Hung
Place of Publication	New York, NY, USA
Publisher	Association for Computing Machinery (ACM)
Pages	1398-1403
Number of pages	6
ISBN (Print)	978-1-4503-0113-8
DOIs	https://doi.org/10.1145/1982185.1982489
Publication status	Published - 2011
Event	SAC'11 - New York, NY, USA Duration: 21 Mar 2011 → 24 Mar 2011

Publication series

Name
Publisher	ACM

Conference

Conference	SAC'11
Period	21/03/11 → 24/03/11

Keywords

Conf.proc. > 3 pag

Access to Document

10.1145/1982185.1982489

Cite this

Gonzalez Sanchez, A., Lima Maranhao De Abreu, RF., Gross, HG., & van Gemund, AJC. (2011). An Empirical Study on the Usage of Testability Information to Fault Localization in Software. In W. Chu, WE. Wang, MJ. Palakal, & C.-C. Hung (Eds.), 2011 ACM International Symposium on Applied Computing (SAC'11) (pp. 1398-1403). Association for Computing Machinery (ACM). https://doi.org/10.1145/1982185.1982489

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Gonzalez Sanchez, A, Lima Maranhao De Abreu, RF, Gross, HG & van Gemund, AJC 2011, An Empirical Study on the Usage of Testability Information to Fault Localization in Software. in W Chu, WE Wang, MJ Palakal & C-C Hung (eds), 2011 ACM International Symposium on Applied Computing (SAC'11). Association for Computing Machinery (ACM), New York, NY, USA, pp. 1398-1403, SAC'11, 21/03/11. https://doi.org/10.1145/1982185.1982489

An Empirical Study on the Usage of Testability Information to Fault Localization in Software. / Gonzalez Sanchez, A; Lima Maranhao De Abreu, RF; Gross, HG et al.
2011 ACM International Symposium on Applied Computing (SAC'11). ed. / W Chu; WE Wang; MJ Palakal; C-C Hung. New York, NY, USA: Association for Computing Machinery (ACM), 2011. p. 1398-1403.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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M3 - Conference contribution

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Gonzalez Sanchez A, Lima Maranhao De Abreu RF, Gross HG, van Gemund AJC. An Empirical Study on the Usage of Testability Information to Fault Localization in Software. In Chu W, Wang WE, Palakal MJ, Hung CC, editors, 2011 ACM International Symposium on Applied Computing (SAC'11). New York, NY, USA: Association for Computing Machinery (ACM). 2011. p. 1398-1403 doi: 10.1145/1982185.1982489