An integrative Kernel method dealing with diverse measurement noise in classification

Y Li, D de Ridder, RPW Duin, MJT Reinders

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationProceedings of the thirteenth annual Conference of the Advanced School for Computing and imaging
EditorsF.W. Jansen, G.E.O. Pierre, C.J. Veenman, J.W.J. Heijnsdijk
Place of PublicationDelft
PublisherASCI
Pages127-134
Number of pages8
ISBN (Print)978-90-810849-2-5
Publication statusPublished - 2007
EventThe thirteenth annual conference of the Advanced School for Computing and Imaging, Heijen Nederland - Delft
Duration: 13 Jun 200715 Jun 2007

Publication series

Name
PublisherASCI

Conference

ConferenceThe thirteenth annual conference of the Advanced School for Computing and Imaging, Heijen Nederland
Period13/06/0715/06/07

Keywords

  • conference contrib. refereed
  • Vakpubl., Overig wet. > 3 pag

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