Analysis and calibration of process variations for an array of temperature sensors

S. Xie; A. Abarca; J. Markenhof; Xiaoliang Ge; A. Theuwissen

doi:10.1109/ICSENS.2017.8233959

Analysis and calibration of process variations for an array of temperature sensors

S. Xie, A. Abarca, J. Markenhof, Xiaoliang Ge, A. Theuwissen

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Abstract

This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).

Original language	English
Title of host publication	Proceedings of IEEE Sensors Conference 2017
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	1-3
Number of pages	3
ISBN (Electronic)	978-1-5090-1012-7
ISBN (Print)	978-1-5090-1013-4
DOIs	https://doi.org/10.1109/ICSENS.2017.8233959
Publication status	Published - 2017
Event	IEEE SENSORS 2017 - Glasgow, United Kingdom Duration: 29 Oct 2017 → 1 Nov 2017 http://ieee-sensors2017.org/

Conference

Conference	IEEE SENSORS 2017
Country/Territory	United Kingdom
City	Glasgow
Period	29/10/17 → 1/11/17
Internet address	http://ieee-sensors2017.org/

Keywords

BJT based temperature sensor
CMOS image sensor
sensor array
calibration

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10.1109/ICSENS.2017.8233959

Cite this

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title = "Analysis and calibration of process variations for an array of temperature sensors",

abstract = "This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).",

keywords = "BJT based temperature sensor, CMOS image sensor, sensor array, calibration",

author = "S. Xie and A. Abarca and J. Markenhof and Xiaoliang Ge and A. Theuwissen",

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language = "English",

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T1 - Analysis and calibration of process variations for an array of temperature sensors

AU - Xie, S.

AU - Abarca, A.

AU - Markenhof, J.

AU - Ge, Xiaoliang

AU - Theuwissen, A.

PY - 2017

Y1 - 2017

N2 - This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).

AB - This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).

KW - BJT based temperature sensor

KW - CMOS image sensor

KW - sensor array

KW - calibration

U2 - 10.1109/ICSENS.2017.8233959

DO - 10.1109/ICSENS.2017.8233959

M3 - Conference contribution

SN - 978-1-5090-1013-4

SP - 1

EP - 3

BT - Proceedings of IEEE Sensors Conference 2017

PB - IEEE

CY - Piscataway, NJ

T2 - IEEE SENSORS 2017

Y2 - 29 October 2017 through 1 November 2017

ER -

Analysis and calibration of process variations for an array of temperature sensors

Abstract

Conference

Keywords

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