Analysis of chaos in fluidization using electrical capacitance tomography

FT Kuhn, JC Schouten, RF Mudde, CM van den Bleek, B Scarlett

    Research output: Contribution to journalArticleScientificpeer-review

    49 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)361-368
    Number of pages8
    JournalMeasurement Science and Technology
    Issue number7
    Publication statusPublished - 1996

    Cite this