Application of x-ray computed tomography in silicon solar cells

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Original language	English
Title of host publication	Proceedings 35th IEEE Photovoltaic Specialists Conference (PVSC), June 20-25, 2010, Honolulu, Hawaii
Editors	JD Meakin
Publisher	IEEE Society
Pages	1-6
Number of pages	6
ISBN (Print)	978-1-4244-5890-5
Publication status	Published - 2010
Event	PVSC 2010: 35th IEEE Photovoltaic Specialists Conference - Honolulu, HI, United States Duration: 20 Jun 2010 → 25 Jun 2010 Conference number: 35

Cite this

@inproceedings{3eda814d2cc04511b4c67f35805b7fcc,

title = "Application of x-ray computed tomography in silicon solar cells",

author = "V Popovich and W Verwaal and M Janssen and IJ Bennett and IM Richardson",

year = "2010",

language = "English",

isbn = "978-1-4244-5890-5",

pages = "1--6",

editor = "JD Meakin",

booktitle = "Proceedings 35th IEEE Photovoltaic Specialists Conference (PVSC), June 20-25, 2010, Honolulu, Hawaii",

publisher = "IEEE Society",

note = "PVSC 2010 : 35th IEEE Photovoltaic Specialists Conference, PVSC ; Conference date: 20-06-2010 Through 25-06-2010",

}

Application of x-ray computed tomography in silicon solar cells. / Popovich, V; Verwaal, W; Janssen, M et al.
Proceedings 35th IEEE Photovoltaic Specialists Conference (PVSC), June 20-25, 2010, Honolulu, Hawaii. ed. / JD Meakin. IEEE Society, 2010. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Application of x-ray computed tomography in silicon solar cells

AU - Popovich, V

AU - Verwaal, W

AU - Janssen, M

AU - Bennett, IJ

AU - Richardson, IM

N1 - Conference code: 35

PY - 2010

Y1 - 2010

M3 - Conference contribution

SN - 978-1-4244-5890-5

SP - 1

EP - 6

BT - Proceedings 35th IEEE Photovoltaic Specialists Conference (PVSC), June 20-25, 2010, Honolulu, Hawaii

A2 - Meakin, JD

PB - IEEE Society

T2 - PVSC 2010

Y2 - 20 June 2010 through 25 June 2010

ER -