@inproceedings{3c4d4dafe6124bfb94ff7439f9904555,
title = "Approximating infinite dynamic behavior for DRAM cell defects",
keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Conf.proc. > 3 pag",
author = "Z Al-Ars and {van de Goor}, AJ",
year = "2002",
language = "Undefined/Unknown",
isbn = "0-7695-1570-3",
publisher = "IEEE Society",
pages = "401--407",
booktitle = "20th VLSI Test symposium Proceedings",
note = "20th IEEE VLSI Test symposium ; Conference date: 28-04-2002 Through 02-05-2002",
}