Standard

Automated Fault Diagnosis in Embedded Systems. / Zoeteweij, P; Pietersma, J; Abreu, RF; Feldman, AB; van Gemund, AJC.

Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.. ed. / s.n. Los Alamitos, USA : IEEE, 2008. p. 103-110.

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Harvard

Zoeteweij, P, Pietersma, J, Abreu, RF, Feldman, AB & van Gemund, AJC 2008, Automated Fault Diagnosis in Embedded Systems. in s.n. (ed.), Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.. IEEE, Los Alamitos, USA, pp. 103-110, SSIRI 2008, 14/07/08.

APA

Zoeteweij, P., Pietersma, J., Abreu, RF., Feldman, AB., & van Gemund, AJC. (2008). Automated Fault Diagnosis in Embedded Systems. In s.n. (Ed.), Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n. (pp. 103-110). IEEE.

Vancouver

Zoeteweij P, Pietersma J, Abreu RF, Feldman AB, van Gemund AJC. Automated Fault Diagnosis in Embedded Systems. In s.n., editor, Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.. Los Alamitos, USA: IEEE. 2008. p. 103-110

Author

Zoeteweij, P ; Pietersma, J ; Abreu, RF ; Feldman, AB ; van Gemund, AJC. / Automated Fault Diagnosis in Embedded Systems. Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.. editor / s.n. Los Alamitos, USA : IEEE, 2008. pp. 103-110

BibTeX

@inproceedings{d65116a650ad417792b6e9fa5f2866c8,
title = "Automated Fault Diagnosis in Embedded Systems",
keywords = "Conf.proc. > 3 pag",
author = "P Zoeteweij and J Pietersma and RF Abreu and AB Feldman and {van Gemund}, AJC",
note = "Zoeteweij:2008.sirri; null ; Conference date: 14-07-2008 Through 17-07-2008",
year = "2008",
language = "Undefined/Unknown",
publisher = "IEEE",
pages = "103--110",
editor = "s.n.",
booktitle = "Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.",
address = "United States",

}

RIS

TY - GEN

T1 - Automated Fault Diagnosis in Embedded Systems

AU - Zoeteweij, P

AU - Pietersma, J

AU - Abreu, RF

AU - Feldman, AB

AU - van Gemund, AJC

N1 - Zoeteweij:2008.sirri

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 103

EP - 110

BT - Proceedings of the 2nd IEEE International Conference on Secure Systems Integration and Reliability Improvement (SSIRI'08)s.n.

A2 - s.n., null

PB - IEEE

CY - Los Alamitos, USA

Y2 - 14 July 2008 through 17 July 2008

ER -

ID: 2886126