Badwidth analysis of functional interconnects used as test access mechanism

A van den Berg, P Ren, E Marinissen, GN Gaydadjiev, KGW Goossens

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	453-464
Number of pages	12
Journal	Journal of Electronic Testing: theory and applications
Volume	26
Issue number	4
Publication status	Published - 2010

Keywords

@article{34e3f47af1064104b33ffbf8938169af,

title = "Badwidth analysis of functional interconnects used as test access mechanism",

keywords = "CWTS JFIS < 0.75",

author = "{van den Berg}, A and P Ren and E Marinissen and GN Gaydadjiev and KGW Goossens",

year = "2010",

language = "English",

volume = "26",

pages = "453--464",

journal = "Journal of Electronic Testing: theory and applications",

issn = "0923-8174",

publisher = "Springer",

number = "4",

}

TY - JOUR

T1 - Badwidth analysis of functional interconnects used as test access mechanism

AU - van den Berg, A

AU - Ren, P

AU - Marinissen, E

AU - Gaydadjiev, GN

AU - Goossens, KGW

PY - 2010

Y1 - 2010

KW - CWTS JFIS < 0.75

M3 - Article

SN - 0923-8174

VL - 26

SP - 453

EP - 464

JO - Journal of Electronic Testing: theory and applications

JF - Journal of Electronic Testing: theory and applications

IS - 4

ER -