Bias temperature instability analysis of FinFET based SRAM cells

MSK Seyab; IO Agbo; S Hamdioui; H Kukner; B Kaczer; P Raghavan; F Catthoor

doi:10.7873/DATE.2014.044

Bias temperature instability analysis of FinFET based SRAM cells

MSK Seyab, IO Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

47 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 2014 International Conference on Design, Automation & Test in Europe
Editors	W Nebel, G Fettweis
Place of Publication	Leuven, Belgium
Publisher	EDAA
Pages	1-6
Number of pages	6
ISBN (Print)	978-3-9815370-2-4
DOIs	https://doi.org/10.7873/DATE.2014.044
Publication status	Published - 2014
Event	DATE '14, Dresden, Germany - Leuven, Belgium Duration: 24 Mar 2014 → 28 Mar 2014

Publication series

Name
Publisher	EDAA

Conference

Conference	DATE '14, Dresden, Germany
Period	24/03/14 → 28/03/14

Access to Document

10.7873/DATE.2014.044

Cite this

@inproceedings{4ca44d98344e4e5bb010fdcf076d71ad,

title = "Bias temperature instability analysis of FinFET based SRAM cells",

author = "MSK Seyab and IO Agbo and S Hamdioui and H Kukner and B Kaczer and P Raghavan and F Catthoor",

year = "2014",

doi = "10.7873/DATE.2014.044",

language = "English",

isbn = "978-3-9815370-2-4",

publisher = "EDAA",

pages = "1--6",

editor = "W Nebel and G Fettweis",

booktitle = "Proceedings of the 2014 International Conference on Design, Automation & Test in Europe",

note = "DATE '14, Dresden, Germany ; Conference date: 24-03-2014 Through 28-03-2014",

}

Seyab, MSK, Agbo, IO, Hamdioui, S, Kukner, H, Kaczer, B, Raghavan, P & Catthoor, F 2014, Bias temperature instability analysis of FinFET based SRAM cells. in W Nebel & G Fettweis (eds), Proceedings of the 2014 International Conference on Design, Automation & Test in Europe. EDAA, Leuven, Belgium, pp. 1-6, DATE '14, Dresden, Germany, 24/03/14. https://doi.org/10.7873/DATE.2014.044

Bias temperature instability analysis of FinFET based SRAM cells. / Seyab, MSK; Agbo, IO; Hamdioui, S et al.
Proceedings of the 2014 International Conference on Design, Automation & Test in Europe. ed. / W Nebel; G Fettweis. Leuven, Belgium: EDAA, 2014. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Bias temperature instability analysis of FinFET based SRAM cells

AU - Seyab, MSK

AU - Agbo, IO

AU - Hamdioui, S

AU - Kukner, H

AU - Kaczer, B

AU - Raghavan, P

AU - Catthoor, F

PY - 2014

Y1 - 2014

U2 - 10.7873/DATE.2014.044

DO - 10.7873/DATE.2014.044

M3 - Conference contribution

SN - 978-3-9815370-2-4

SP - 1

EP - 6

BT - Proceedings of the 2014 International Conference on Design, Automation & Test in Europe

A2 - Nebel, W

A2 - Fettweis, G

PB - EDAA

CY - Leuven, Belgium

T2 - DATE '14, Dresden, Germany

Y2 - 24 March 2014 through 28 March 2014

ER -