BIST enhancement for detecting bit/byte write enable faults in SOC SCRAMs

S Hamdioui, Z Al-Ars, J Jimenez, J Calero

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publication2nd IEEE Intl. Conf. on Signals, Circuits & Systems
Editors s.n.
Place of Publications.l.
PublisherIEEE Society
Pages1-5
Number of pages5
ISBN (Print)978-1-4244-2628-7
Publication statusPublished - 2008
EventSCS 2008 - s.l.
Duration: 7 Nov 20089 Nov 2008

Publication series

Name
PublisherIEEE

Conference

ConferenceSCS 2008
Period7/11/089/11/08

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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