Bit line coupling memory tests for single cell fails in SRAMs

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	28th IEEE VLSI test symposium
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	1-6
Number of pages	6
Publication status	Published - 2010
Event	VTS 2010 - Piscataway Duration: 19 Apr 2010 → 22 Apr 2010

Name
Publisher	IEEE

Conference	VTS 2010
Period	19/04/10 → 22/04/10

Keywords

@inproceedings{0fcf89ed97424b2b8bb9bce53f1b89c1,

title = "Bit line coupling memory tests for single cell fails in SRAMs",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "IS Irobi and Z Al-Ars and S Hamdioui",

year = "2010",

language = "Undefined/Unknown",

publisher = "IEEE Society",

pages = "1--6",

editor = "s.n.",

booktitle = "28th IEEE VLSI test symposium",

note = "VTS 2010 ; Conference date: 19-04-2010 Through 22-04-2010",

}

TY - GEN

T1 - Bit line coupling memory tests for single cell fails in SRAMs

AU - Irobi, IS

AU - Al-Ars, Z

AU - Hamdioui, S

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 1

EP - 6

BT - 28th IEEE VLSI test symposium

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

T2 - VTS 2010

Y2 - 19 April 2010 through 22 April 2010

ER -