Capturing appearance variation in active appearance models

LJP van der Maaten, EA Hendriks

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

15 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 23rd IEEE Conference on Computer Vision and Pattern Recognition
Editors S.N
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages34-41
Number of pages8
ISBN (Print)978-1-4244-7030-3
Publication statusPublished - 2010
EventThe 23rd IEEE Conference on Computer Vision and Pattern Recognition - Piscataway, NJ, USA
Duration: 13 Jun 201018 Jun 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceThe 23rd IEEE Conference on Computer Vision and Pattern Recognition
Period13/06/1018/06/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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