• A.L.C. Roelen
  • R Wever
  • RM Cooke
  • HP Lopuhaa
  • M. Simons
  • P.J.L. Valk
Original languageUndefined/Unknown
Title of host publicationSafety and Reliability
EditorsTJ Bedford, PHAJM van Gelder
Place of PublicationLisse
PublisherSwets & Zeitlinger
Pages1321-1327
Number of pages7
ISBN (Print)90-5809-551-7
Publication statusPublished - 2003

    Research areas

  • Wiskunde en Informatica, Techniek, technische Wiskunde en Informatica, Boekdeel internat.wet

ID: 3197163