Standard

Causal modeling for integrated safety at airports. / Roelen, A.L.C.; Wever, R; Cooke, RM; Lopuhaa, HP; Simons, M.; Valk, P.J.L.

Safety and Reliability. ed. / TJ Bedford; PHAJM van Gelder. Lisse : Swets & Zeitlinger, 2003. p. 1321-1327.

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Harvard

Roelen, ALC, Wever, R, Cooke, RM, Lopuhaa, HP, Simons, M & Valk, PJL 2003, Causal modeling for integrated safety at airports. in TJ Bedford & PHAJM van Gelder (eds), Safety and Reliability. Swets & Zeitlinger, Lisse, pp. 1321-1327.

APA

Roelen, A. L. C., Wever, R., Cooke, RM., Lopuhaa, HP., Simons, M., & Valk, P. J. L. (2003). Causal modeling for integrated safety at airports. In TJ. Bedford, & PHAJM. van Gelder (Eds.), Safety and Reliability (pp. 1321-1327). Lisse: Swets & Zeitlinger.

Vancouver

Roelen ALC, Wever R, Cooke RM, Lopuhaa HP, Simons M, Valk PJL. Causal modeling for integrated safety at airports. In Bedford TJ, van Gelder PHAJM, editors, Safety and Reliability. Lisse: Swets & Zeitlinger. 2003. p. 1321-1327

Author

Roelen, A.L.C. ; Wever, R ; Cooke, RM ; Lopuhaa, HP ; Simons, M. ; Valk, P.J.L. / Causal modeling for integrated safety at airports. Safety and Reliability. editor / TJ Bedford ; PHAJM van Gelder. Lisse : Swets & Zeitlinger, 2003. pp. 1321-1327

BibTeX

@inbook{056af801908b42789b6a52f7cde5bbaa,
title = "Causal modeling for integrated safety at airports",
keywords = "Wiskunde en Informatica, Techniek, technische Wiskunde en Informatica, Boekdeel internat.wet",
author = "A.L.C. Roelen and R Wever and RM Cooke and HP Lopuhaa and M. Simons and P.J.L. Valk",
year = "2003",
language = "Undefined/Unknown",
isbn = "90-5809-551-7",
pages = "1321--1327",
editor = "TJ Bedford and {van Gelder}, PHAJM",
booktitle = "Safety and Reliability",
publisher = "Swets & Zeitlinger",
address = "Netherlands",

}

RIS

TY - CHAP

T1 - Causal modeling for integrated safety at airports

AU - Roelen, A.L.C.

AU - Wever, R

AU - Cooke, RM

AU - Lopuhaa, HP

AU - Simons, M.

AU - Valk, P.J.L.

PY - 2003

Y1 - 2003

KW - Wiskunde en Informatica

KW - Techniek

KW - technische Wiskunde en Informatica

KW - Boekdeel internat.wet

M3 - Chapter

SN - 90-5809-551-7

SP - 1321

EP - 1327

BT - Safety and Reliability

A2 - Bedford, TJ

A2 - van Gelder, PHAJM

PB - Swets & Zeitlinger

CY - Lisse

ER -

ID: 3197163