Characteristics of a PSD range image sensor fabricated in a standard bipolar process

M de Bakker, FR Boddeke, PW Verbeek

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ASCI'97 Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging
Editors	HCHE Bal, PP Jonker, JFM Tonino
Pages	42-48
Number of pages	7
Publication status	Published - 1997

Cite this

@inproceedings{2ad68ee95f5e449cb33b1fbeb9266760,

title = "Characteristics of a PSD range image sensor fabricated in a standard bipolar process",

author = "{de Bakker}, M and FR Boddeke and PW Verbeek",

year = "1997",

language = "Undefined/Unknown",

isbn = "90-803086-2-5",

pages = "42--48",

editor = "HCHE Bal and PP Jonker and JFM Tonino",

booktitle = "ASCI'97 Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging",

}

Characteristics of a PSD range image sensor fabricated in a standard bipolar process. / de Bakker, M; Boddeke, FR; Verbeek, PW.
ASCI'97 Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging. ed. / HCHE Bal; PP Jonker; JFM Tonino. 1997. p. 42-48.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Characteristics of a PSD range image sensor fabricated in a standard bipolar process

AU - de Bakker, M

AU - Boddeke, FR

AU - Verbeek, PW

PY - 1997

Y1 - 1997

M3 - Conference contribution

SN - 90-803086-2-5

SP - 42

EP - 48

BT - ASCI'97 Proc. 3rd Annual Conference of the Advanced School for Computing and Imaging

A2 - Bal, HCHE

A2 - Jonker, PP

A2 - Tonino, JFM

ER -