Characterization and modeling of a sub-micron milling process limited by agglomeration phenomena

SLA Hennart, P van Hee, VAP Drouet, MC Domingues, w.j. wildeboer, GMH Meesters

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	484-495
Number of pages	12
Journal	Chemical Engineering Science
Volume	71
DOIs	https://doi.org/10.1016/j.ces.2011.11.010
Publication status	Published - 2012

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title = "Characterization and modeling of a sub-micron milling process limited by agglomeration phenomena",

author = "SLA Hennart and Hee, {P van} and VAP Drouet and MC Domingues and w.j. wildeboer and GMH Meesters",

year = "2012",

doi = "10.1016/j.ces.2011.11.010",

language = "English",

volume = "71",

pages = "484--495",

journal = "Chemical Engineering Science",

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publisher = "Elsevier",

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T1 - Characterization and modeling of a sub-micron milling process limited by agglomeration phenomena

AU - Hennart, SLA

AU - Hee, P van

AU - Drouet, VAP

AU - Domingues, MC

AU - wildeboer, w.j.

AU - Meesters, GMH

PY - 2012

Y1 - 2012

U2 - 10.1016/j.ces.2011.11.010

DO - 10.1016/j.ces.2011.11.010

M3 - Article

SN - 0009-2509

VL - 71

SP - 484

EP - 495

JO - Chemical Engineering Science

JF - Chemical Engineering Science

ER -