Characterization of ultrasharp field emitters by projection microscopy

MJ Fransen, EPN Damen, C Schiller, TL van Rooy, HB Groen, P Kruit

    Research output: Contribution to journalArticleScientificpeer-review

    14 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)107-112
    Number of pages6
    JournalApplied Surface Science
    Volume94/95
    Publication statusPublished - 1996

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