Characterization one-class datasets

DMJ Tax; RPW Duin

Characterization one-class datasets

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 16th Annual Symposium of the Pattern Recognition Association of South Africa
Editors	F Nicolls
Place of Publication	s.l.
Publisher	IAPR
Pages	21-26
Number of pages	6
ISBN (Print)	0-7992-2264-X
Publication status	Published - 2005
Event	16th Annual Symposium of the Pattern Recognition Association of South Africa, Langebaan, South Africa - s.l. Duration: 23 Nov 2005 → 25 Nov 2005

Publication series

Name
Publisher	IAPR

Conference

Conference	16th Annual Symposium of the Pattern Recognition Association of South Africa, Langebaan, South Africa
Period	23/11/05 → 25/11/05

Keywords

Wiskunde en Informatica
Techniek
technische Wiskunde en Informatica
conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{33f44261d5584810b2aece2e4a9702a4,

title = "Characterization one-class datasets",

keywords = "Wiskunde en Informatica, Techniek, technische Wiskunde en Informatica, conference contrib. refereed, Conf.proc. > 3 pag",

author = "DMJ Tax and RPW Duin",

year = "2005",

language = "Undefined/Unknown",

isbn = "0-7992-2264-X",

publisher = "IAPR",

pages = "21--26",

editor = "F Nicolls",

booktitle = "Proceedings of the 16th Annual Symposium of the Pattern Recognition Association of South Africa",

note = "16th Annual Symposium of the Pattern Recognition Association of South Africa, Langebaan, South Africa ; Conference date: 23-11-2005 Through 25-11-2005",

}

TY - GEN

T1 - Characterization one-class datasets

AU - Tax, DMJ

AU - Duin, RPW

PY - 2005

Y1 - 2005

KW - Wiskunde en Informatica

KW - Techniek

KW - technische Wiskunde en Informatica

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7992-2264-X

SP - 21

EP - 26

BT - Proceedings of the 16th Annual Symposium of the Pattern Recognition Association of South Africa

A2 - Nicolls, F

PB - IAPR

CY - s.l.

T2 - 16th Annual Symposium of the Pattern Recognition Association of South Africa, Langebaan, South Africa

Y2 - 23 November 2005 through 25 November 2005

ER -