@inproceedings{49d0836cad9a4958bd3f2b211a917219,
title = "Combined BEM/FEM resistance modeling of straified substrates with layout-dependent doping patterns in the top layer",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "E Schrik and {van Genderen}, AJ and {van der Meijs}, NP",
year = "2001",
language = "Undefined/Unknown",
isbn = "90-73461-29-4",
publisher = "STW Technology Foundation",
pages = "598--604",
booktitle = "SAFE - ProRISC - SeSens 2001: proceedings CD-ROM",
note = "Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven ; Conference date: 28-11-2001 Through 30-11-2001",
}