Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

IO Agbo; M Taouil; S Hamdioui; S Cosemans; P Weckx; P Raghavan; F Catthoor

doi:10.1109/DTIS.2015.7127371

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

IO Agbo, M Taouil, S Hamdioui, S Cosemans, P Weckx, P Raghavan, F Catthoor

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015
Editors	V Casola
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1-6
Number of pages	6
ISBN (Print)	978-1-4799-1999-4
DOIs	https://doi.org/10.1109/DTIS.2015.7127371
Publication status	Published - 2015
Event	DTIS 2015: 10th International Conference on Design and Technology of Integrated Systems in Nanoscale Era - Naples Duration: 20 Apr 2015 → 24 Apr 2015

Publication series

Name
Publisher	IEEE

Conference

Conference	DTIS 2015
City	Naples
Period	20/04/15 → 24/04/15

Bibliographical note

Harvest
Article number 712371

Access to Document

10.1109/DTIS.2015.7127371

Cite this

Agbo, IO., Taouil, M., Hamdioui, S., Cosemans, S., Weckx, P., Raghavan, P., & Catthoor, F. (2015). Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. In V. Casola (Ed.), Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015 (pp. 1-6). IEEE Society. https://doi.org/10.1109/DTIS.2015.7127371

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title = "Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier",

author = "IO Agbo and M Taouil and S Hamdioui and S Cosemans and P Weckx and P Raghavan and F Catthoor",

note = "Harvest Article number 712371; DTIS 2015 : 10th International Conference on Design and Technology of Integrated Systems in Nanoscale Era ; Conference date: 20-04-2015 Through 24-04-2015",

year = "2015",

doi = "10.1109/DTIS.2015.7127371",

language = "English",

isbn = "978-1-4799-1999-4",

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Agbo, IO, Taouil, M , Hamdioui, S, Cosemans, S, Weckx, P, Raghavan, P & Catthoor, F 2015, Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. in V Casola (ed.), Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015. IEEE Society, Piscataway, NJ, USA, pp. 1-6, DTIS 2015, Naples, 20/04/15. https://doi.org/10.1109/DTIS.2015.7127371

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. / Agbo, IO; Taouil, M ; Hamdioui, S et al.
Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015. ed. / V Casola. Piscataway, NJ, USA: IEEE Society, 2015. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

AU - Agbo, IO

AU - Taouil, M

AU - Hamdioui, S

AU - Cosemans, S

AU - Weckx, P

AU - Raghavan, P

AU - Catthoor, F

N1 - Harvest Article number 712371

PY - 2015

Y1 - 2015

U2 - 10.1109/DTIS.2015.7127371

DO - 10.1109/DTIS.2015.7127371

M3 - Conference contribution

SN - 978-1-4799-1999-4

SP - 1

EP - 6

BT - Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015

A2 - Casola, V

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - DTIS 2015

Y2 - 20 April 2015 through 24 April 2015

ER -

Agbo IO, Taouil M , Hamdioui S, Cosemans S, Weckx P, Raghavan P et al. Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. In Casola V, editor, Proceedings - 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015. Piscataway, NJ, USA: IEEE Society. 2015. p. 1-6 doi: 10.1109/DTIS.2015.7127371