Comparative BTI analysis in nano-scale circuits lifetime

MSK Seyab, S Hamdioui, F Catthoor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publication4th Workshop on design for reliability
Editors s.n.
Place of Publications.l.
Publishers.n.
Pages1-8
Number of pages8
Publication statusPublished - 2012
EventDFR 2012 - s.l.
Duration: 23 Jan 201225 Jan 2012

Publication series

Name
Publishers.n.

Conference

ConferenceDFR 2012
Period23/01/1225/01/12

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