• H Kukner
  • F Khan
  • P Weckx
  • P Raghavan
  • S Hamdioui
  • B Kaczer
  • F Catthoor
  • L van der Perre
  • R Lauwereins
  • G Groeseneken
Original languageEnglish
Pages (from-to)182-193
Number of pages12
JournalIEEE Transactions on Device and Materials Reliability
Volume14
Issue number1
DOIs
Publication statusPublished - 2014

ID: 3363339