Compiler-aided methodology for low overhead on-line testing

G Nazarian; R.M. Seepers; C Strydis; GN Gaydadjiev

doi:10.1109/SAMOS.2013.6621126

Compiler-aided methodology for low overhead on-line testing

G Nazarian, R.M. Seepers, C Strydis, GN Gaydadjiev

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation
Editors	O Silven, H Jeschke
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	219-226
Number of pages	8
ISBN (Print)	978-1-4799-0103-6
DOIs	https://doi.org/10.1109/SAMOS.2013.6621126
Publication status	Published - 2013
Event	IC SAMOS 2013, Samos, Greece - Piscataway, NJ, USA Duration: 15 Jul 2013 → 18 Jul 2013

Publication series

Name
Publisher	IEEE

Conference

Conference	IC SAMOS 2013, Samos, Greece
Period	15/07/13 → 18/07/13

Bibliographical note

Harvest

Access to Document

10.1109/SAMOS.2013.6621126

Cite this

@inproceedings{db3caf735fe4439dba94eb1f522608c4,

title = "Compiler-aided methodology for low overhead on-line testing",

author = "G Nazarian and R.M. Seepers and C Strydis and GN Gaydadjiev",

note = "Harvest; IC SAMOS 2013, Samos, Greece ; Conference date: 15-07-2013 Through 18-07-2013",

year = "2013",

doi = "10.1109/SAMOS.2013.6621126",

language = "English",

isbn = "978-1-4799-0103-6",

publisher = "IEEE Society",

pages = "219--226",

editor = "O Silven and H Jeschke",

booktitle = "Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation",

}

Nazarian, G, Seepers, RM, Strydis, C & Gaydadjiev, GN 2013, Compiler-aided methodology for low overhead on-line testing. in O Silven & H Jeschke (eds), Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation. IEEE Society, Piscataway, NJ, USA, pp. 219-226, IC SAMOS 2013, Samos, Greece, 15/07/13. https://doi.org/10.1109/SAMOS.2013.6621126

Compiler-aided methodology for low overhead on-line testing. / Nazarian, G; Seepers, R.M.; Strydis, C et al.
Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation. ed. / O Silven; H Jeschke. Piscataway, NJ, USA: IEEE Society, 2013. p. 219-226.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Compiler-aided methodology for low overhead on-line testing

AU - Nazarian, G

AU - Seepers, R.M.

AU - Strydis, C

AU - Gaydadjiev, GN

N1 - Harvest

PY - 2013

Y1 - 2013

U2 - 10.1109/SAMOS.2013.6621126

DO - 10.1109/SAMOS.2013.6621126

M3 - Conference contribution

SN - 978-1-4799-0103-6

SP - 219

EP - 226

BT - Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation

A2 - Silven, O

A2 - Jeschke, H

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - IC SAMOS 2013, Samos, Greece

Y2 - 15 July 2013 through 18 July 2013

ER -