Consequences of RAM bitline twisting for test coverage

I Schanstra, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	DATE'03; design automation and test in Europe
Editors	N Wehn, D Verkest
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	1176-1177
Number of pages	2
ISBN (Print)	0-7695-1870-2
Publication status	Published - 2003
Event	design automation and test in Europe, Messe Munich, Germany - Piscataway Duration: 3 Mar 2003 → 7 Mar 2003

Name
Publisher	IEEE

Conference	design automation and test in Europe, Messe Munich, Germany
Period	3/03/03 → 7/03/03

Keywords

@inproceedings{aa249a1a9a514f2bb13fae90398afd88,

title = "Consequences of RAM bitline twisting for test coverage",

keywords = "Geen BTA classificatie",

author = "I Schanstra and {van de Goor}, AJ",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-7695-1870-2",

publisher = "IEEE Society",

pages = "1176--1177",

editor = "N Wehn and D Verkest",

booktitle = "DATE'03; design automation and test in Europe",

note = "design automation and test in Europe, Messe Munich, Germany ; Conference date: 03-03-2003 Through 07-03-2003",

}

TY - GEN

T1 - Consequences of RAM bitline twisting for test coverage

AU - Schanstra, I

AU - van de Goor, AJ

PY - 2003

Y1 - 2003

KW - Geen BTA classificatie

M3 - Conference contribution

SN - 0-7695-1870-2

SP - 1176

EP - 1177

BT - DATE'03; design automation and test in Europe

A2 - Wehn, N

A2 - Verkest, D

PB - IEEE Society

CY - Piscataway

T2 - design automation and test in Europe, Messe Munich, Germany

Y2 - 3 March 2003 through 7 March 2003

ER -