@inproceedings{aa249a1a9a514f2bb13fae90398afd88,
title = "Consequences of RAM bitline twisting for test coverage",
keywords = "Geen BTA classificatie",
author = "I Schanstra and {van de Goor}, AJ",
year = "2003",
language = "Undefined/Unknown",
isbn = "0-7695-1870-2",
publisher = "IEEE Society",
pages = "1176--1177",
editor = "N Wehn and D Verkest",
booktitle = "DATE'03; design automation and test in Europe",
note = "design automation and test in Europe, Messe Munich, Germany ; Conference date: 03-03-2003 Through 07-03-2003",
}