| Original language | English |
|---|---|
| Pages (from-to) | 1-6 |
| Number of pages | 6 |
| Journal | Microelectronics Reliability |
| Volume | 52 |
| Issue number | 9-10 |
| Publication status | Published - 2012 |
Context aware slope based transistor-level aging model
Research output: Contribution to journal › Article › Scientific › peer-review