Correspondence free 3D statistical shape model fitting to sparse X-ray projections

N Baka; WJ Niessen; BL Kaptein; T van Walsum; L Ferarrini; JHC Reiber; BPF Lelieveldt

doi:10.1117/12.840935

Correspondence free 3D statistical shape model fitting to sparse X-ray projections

N Baka, WJ Niessen, BL Kaptein, T van Walsum, L Ferarrini, JHC Reiber, BPF Lelieveldt

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Medical Imaging 2010: Image processing
Editors	DR Haynor, BM Dawant
Place of Publication	Bellingham, WA, USA
Publisher	SPIE
Pages	1-9
Number of pages	9
ISBN (Print)	9780819480248
DOIs	https://doi.org/10.1117/12.840935
Publication status	Published - 2010
Event	SPIE - Medical imaging 2010: Image processing, San Diego, CA, USA - Bellingham, WA, USA Duration: 14 Feb 2010 → 16 Feb 2010

Publication series

Name
Publisher	SPIE

Name	Proceedings of SPIE- International Society for Optical Engineering
Volume	7623
ISSN (Print)	0277-786X

Conference

Conference	SPIE - Medical imaging 2010: Image processing, San Diego, CA, USA
Period	14/02/10 → 16/02/10

Keywords

academic journal papers
Peer-lijst tijdschrift

Access to Document

10.1117/12.840935

Cite this

Baka, N., Niessen, WJ., Kaptein, BL., van Walsum, T., Ferarrini, L., Reiber, JHC., & Lelieveldt, BPF. (2010). Correspondence free 3D statistical shape model fitting to sparse X-ray projections. In DR. Haynor, & BM. Dawant (Eds.), Medical Imaging 2010: Image processing (pp. 1-9). (Proceedings of SPIE- International Society for Optical Engineering; Vol. 7623). SPIE. https://doi.org/10.1117/12.840935

@inproceedings{9b181e619bd5478db12bc4f13a9617a2,

title = "Correspondence free 3D statistical shape model fitting to sparse X-ray projections",

keywords = "academic journal papers, Peer-lijst tijdschrift",

author = "N Baka and WJ Niessen and BL Kaptein and {van Walsum}, T and L Ferarrini and JHC Reiber and BPF Lelieveldt",

year = "2010",

doi = "10.1117/12.840935",

language = "English",

isbn = "9780819480248",

publisher = "SPIE",

pages = "1--9",

editor = "DR Haynor and BM Dawant",

booktitle = "Medical Imaging 2010: Image processing",

address = "United States",

note = "SPIE - Medical imaging 2010: Image processing, San Diego, CA, USA ; Conference date: 14-02-2010 Through 16-02-2010",

}

Baka, N, Niessen, WJ, Kaptein, BL, van Walsum, T, Ferarrini, L, Reiber, JHC & Lelieveldt, BPF 2010, Correspondence free 3D statistical shape model fitting to sparse X-ray projections. in DR Haynor & BM Dawant (eds), Medical Imaging 2010: Image processing. Proceedings of SPIE- International Society for Optical Engineering, vol. 7623, SPIE, Bellingham, WA, USA, pp. 1-9, SPIE - Medical imaging 2010: Image processing, San Diego, CA, USA, 14/02/10. https://doi.org/10.1117/12.840935

Correspondence free 3D statistical shape model fitting to sparse X-ray projections. / Baka, N; Niessen, WJ; Kaptein, BL et al.
Medical Imaging 2010: Image processing. ed. / DR Haynor; BM Dawant. Bellingham, WA, USA: SPIE, 2010. p. 1-9 (Proceedings of SPIE- International Society for Optical Engineering; Vol. 7623).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Correspondence free 3D statistical shape model fitting to sparse X-ray projections

AU - Baka, N

AU - Niessen, WJ

AU - Kaptein, BL

AU - van Walsum, T

AU - Ferarrini, L

AU - Reiber, JHC

AU - Lelieveldt, BPF

PY - 2010

Y1 - 2010

KW - academic journal papers

KW - Peer-lijst tijdschrift

U2 - 10.1117/12.840935

DO - 10.1117/12.840935

M3 - Conference contribution

SN - 9780819480248

SP - 1

EP - 9

BT - Medical Imaging 2010: Image processing

A2 - Haynor, DR

A2 - Dawant, BM

PB - SPIE

CY - Bellingham, WA, USA

T2 - SPIE - Medical imaging 2010: Image processing, San Diego, CA, USA

Y2 - 14 February 2010 through 16 February 2010

ER -