Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)
Editors	BM Al-Hashimi, W Rosenstiel
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	265-268
Number of pages	4
ISBN (Print)	978-3-9810801-7-9
Publication status	Published - 2011
Event	DATE'11 - Leuven, Belgium Duration: 14 Mar 2011 → 18 Mar 2011

Name
Publisher	IEEE

Conference	DATE'11
Period	14/03/11 → 18/03/11

Keywords

@inproceedings{4b131fc934e4402db86ddbee4bc4fe98,

title = "Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories",

keywords = "Conf.proc. > 3 pag",

author = "NZB Haron and S Hamdioui",

year = "2011",

language = "English",

isbn = "978-3-9810801-7-9",

publisher = "IEEE Society",

pages = "265--268",

editor = "BM Al-Hashimi and W Rosenstiel",

booktitle = "Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)",

note = "DATE'11 ; Conference date: 14-03-2011 Through 18-03-2011",

}

Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories. / Haron, NZB; Hamdioui, S.
Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011). ed. / BM Al-Hashimi; W Rosenstiel. Piscataway, NJ, USA: IEEE Society, 2011. p. 265-268.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories

AU - Haron, NZB

AU - Hamdioui, S

PY - 2011

Y1 - 2011

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-3-9810801-7-9

SP - 265

EP - 268

BT - Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)

A2 - Al-Hashimi, BM

A2 - Rosenstiel, W

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - DATE'11

Y2 - 14 March 2011 through 18 March 2011

ER -