Original language | English |
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Pages (from-to) | 2512-2520 |
Number of pages | 9 |
Journal | Journal of Parallel and Distributed Computing |
Volume | 74 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2014 |
Critical transistors nexus based circuit-level aging assessment and prediction
Research output: Contribution to journal › Article › Scientific › peer-review
1
Citation
(Scopus)