Critical transistors nexus based circuit-level aging assessment and prediction

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)2512-2520
Number of pages9
JournalJournal of Parallel and Distributed Computing
Volume74
Issue number6
DOIs
Publication statusPublished - 2014

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